2019 IEEE The 3rd International Conference on Circuits, Systems and Devices
2019年 IEEE 第三届电路, 系统与器件国际会议
August 23-25, 2019 | Chengdu, China
8月23-25日 | 中国 成都

Keynote Speakers

Juin J. Liou IEEE Fellow | Chair Professor and Director

Zhengzhou University, China

Title: "Electromagnetic Compatibility (EMC) for Integrated Circuits:Challenges and Solutions"

Abstract: Electromagnetic compatibility (EMC) is one of the most prevalent threats to the reliability of electronic components. It is an event in which a radiated or conducted pulse is generated due to a power switching or electrostatic discharge event. Designing on- and off-chip structures to protect integrated circuits against the EMC stress is a high priority in the semiconductor industry. The continuing advancement in semiconductor technology makes the EMC-induced failures even more prominent. In fact, many semiconductor companies worldwide are having difficulties in meeting the increasingly stringent EMC protection requirements for various electronics applications, and one can predict with certainty that the availability of effective and robust EMC protection solutions will become a critical and essential factor to the well-being and commercialization of next-generation electronics.

This talk focuses on the conducted electromagnetic compatibility which is one of the critical requirements for the reliability of modern and future electronics. The topics include the EMC standards, models, protection schemes, and testing classifications and results. Challenges and solutions associated with designing and optimizing the on- and off-chip EMC protection solutions will also be addressed.

Biography: Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, Florida, USA in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida (UCF), Orlando, Florida, USA, where he held the positions of Pegasus Distinguished Professor, Lockheed Martin St. Laurent Professor, and UCF-Analog Devices Fellow. His research interests are electrostatic discharge (ESD) protection design, modeling and simulation, and characterization. Currently, he serves as the Chair Professor and Director of School of Microelectronics at Zhengzhou University, China.

Dr. Liou holds 13 U.S. patents, and has published 13 books, more than 300 journal papers (including 22 invited review articles), and more than 240 papers (including 110 keynote and invited papers) in international and national conference proceedings. He has been awarded more than $14.0 million of research contracts and grants from federal agencies (i.e., NSF, DARPA, Navy, Air Force, NASA, NIST), state government, and industry (i.e., Semiconductor Research Corp., Intel Corp., Intersil Corp., Lucent Technologies, Alcatel Space, Conexant Systems, Texas Instruments, Fairchild Semiconductor, National Semiconductor, Analog Devices, Maxim Integrated Systems, Allegro Microsystems, RF Micro Device, Lockheed Martin), and has held consulting positions with research laboratories and companies in the United States, China, Japan, Taiwan, and Singapore. In addition, Dr. Liou has served as a technical reviewer for various journals and publishers, general chair or technical program chair for a large number of international conferences, regional editor (in USA, Canada and South America) of the Microelectronics Reliability journal, and guest editor of 6 special issues in the IEEE Journal on Emerging and Selected Topics in Circuits and Systems, Microelectronics Reliability, Solid-State Electronics, and International Journal of Antennas and Propagation.

Dr. Liou received ten different awards on excellence in teaching and research from the University of Central Florida (UCF) and six different awards from the IEEE. Among them, he was awarded the UCF Pegasus Distinguished Professor (2009) – the highest honor bestowed to a faculty member at UCF, UCF Distinguished Researcher Award (four times: 1992, 1998, 2002, 2009), UCF Research Incentive Award (four times: 2000, 2005, 2010, 2015), IEEE Joseph M. Biedenbach Outstanding Engineering Educator Award in 2004 for exemplary engineering teaching, research, and international collaboration, and IEEE Electron Devices Society Education Award in 2014 for promoting and inspiring global education and learning in the field of electron devices. His other honors are Fellow of IEEE, Fellow of IET, Fellow of Singapore Institute of Manufacturing Technology, Fellow of UCF-Analog Devices, Distinguished Lecturer of IEEE Electron Device Society (EDS), and Distinguished Lecturer of National Science Council. He holds several honorary professorships, including the Chang Jiang Scholar Endowed Professor of Ministry of Education, China – the highest honorary professorship in China, Talented Expert of Ministry of Organization, China, Renowned Overseas Scholar of Ministry of Education, China, NSVL Distinguished Professor of National Semiconductor Corp., USA, International Honorary Chair Professor of National Taipei University of Technology, Taiwan, Chang Gung Endowed Professor of Chang Gung University, Taiwan, Feng Chia Chair Professor of Feng Chia University, Taiwan, Chunhui Eminent Scholar of Peking University, China, and Cao Guang-Biao Endowed Professor of Zhejiang University, China. Dr. Liou was a recipient of U.S. Air Force Fellowship Award and National University Singapore Fellowship Award.

Dr. Liou had served as the IEEE EDS Vice-President of Regions/Chapters, IEEE EDS Treasurer, IEEE EDS Finance Committee Chair, Member of IEEE EDS Board of Governors, and Member of IEEE EDS Educational Activities Committee.

Prof. Jong-Ho Lee, IEEE Fellow

Seoul National University, Korea

Biography: Prof. Lee received the B.S. degree from Kyungpook National University, Daegu, Korea, in 1987 and the M.S. and Ph.D. degrees from Seoul National University, Seoul, in 1989 and 1993, respectively, all in electronic engineering.

In 1993, he worked on advanced BiCMOS process development at ISRC, Seoul National University as an Engineer. In 1994, he was with the School of Electrical Engineering, Wonkwang University, Iksan, Chonpuk, Korea. In 2002, he moved to Kyungpook National University, Daegu Korea, as a Professor of the School of Electrical Engineering and Computer Science. Since September 2009, he has been a Professor in the School of Electrical and Computer Engineering, Seoul National University, Seoul Korea. From 1994 to 1998, he was with ETRI as an invited member of technical staff, where he worked on deep submicron MOS devices, device isolation. From August 1998 to July 1999, he was with Massachusetts Institute of Technology, Cambridge, as a postdoctoral fellow, where he was engaged in the research on sub-100 nm double-gate CMOS devices.

Prof. Lee is a Lifetime Member of the Institute of Electronics Engineers of Korea (IEEK) and IEEE Fellow. He has been served as a subcommittee member of IEDM, ITRS ERD member, a general chair of IPFA2011, and IEEE EDS Korea chapter chair. He received many awards for excellent research papers and research excellence. He invented bulk FinFET, Saddle FinFET (or bCAT) for DRAM cell transistors, and NAND flash cell string with virtual source/drain. These three inventions are key technologies which have been applying for mass production in industry.

Prof. Shiwei Feng

Beijing University of Technology, China

Biography: Prof. Shiwei Feng, PhD supervisor, is the dean of College of Microelectronic and the vice director of the Faculty of Information Technology, Beijing University of Technology.
He took the post doctorate research on the novel microelectronic devices and reliabilities in Howard University in 2000, and in Rutgers University during 2001 and 2002. He was elected as the Beijing Innovative Talents Scheme in 1994 and is the recipient of the “National Talents Engineering” from the Ministry of Human Resources and Social Security of the People’s Republic of China. He received the government special allowance from China government. He also got the “Excellent Youth Teacher” from Beijing Government is a “Famous teachers in Beijing”. He is the expert of International Cooperation Projects of the Ministry of Science and Technology, the reviewers of IEEE Electron Device Letter,IEEE Transaction on Electron Device etc. He received the Second and Third prize of the Provincial and Ministerial Progress for 4 times, and published about 150 research papers including 80 SCI and 30 patents.