Kyushu Institute of Technology, Japan
Xiaoqing WEN (firstname.lastname@example.org) received a B.E. degree from Tsinghua University, China, in 1986, a M.E. degree from Hiroshima University, Japan, in 1990, and a Ph.D. degree from Osaka University, Japan, in 1993. From 1993 to 1997, he was a Lecturer at Akita University, Japan. He was a Visiting Researcher at University of Wisconsin, Madison, USA, from October 1995 to March 1996. He worked at SynTest Technologies, Inc., USA, from 1998 to 2003 and served as its Vice President and Chief Technology Officer. In 2004, he joined Kyushu Institute of Technology, Japan, where he is currently a Professor and Chair of Department of Creative Informatics. He is a Co-Founder/Co-Chair of the Technical Activity Committee on Power-Aware Testing under the Test Technology Technical Council of the IEEE Computer Society. He is serving as Associate Editors for IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems as well as IEEE Transactions on Very Large Scale Integration Systems. He co-authored and co-edited two widely-referred books: “VLSI Test Principles and Architectures: Design for Testability” and “Power-Aware Testing and Test Strategies for Low Power Devices”. His research interests include design, test, and diagnosis of VLSI circuits. He holds 43 U.S. Patents and 14 Japan Patents. He received the 2008 Society Best Paper Award from the Information Systems Society of Institute of Electronics, Information and Communication Engineers for his pioneering work on mitigating capture power in at-speed scan testing of low-power VLSI circuits. He was elevated to a Fellow of IEEE in 2012 for contributions to testing of integrated circuits. (Homepage: http://aries3a.cse.kyutech.ac.jp/~wen/)
Juin J. Liou
Shenzhen University, China
Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida (UCF), Orlando, Florida where he held the positions of Pegasus Distinguished Professor, Lockheed Martin St. Laurent Professor, and UCF-Analog Devices Fellow. Currently, Dr. Liou is a chair professor at Shenzhen University, China. His research interests are electrostatic discharge (ESD) protection design, modeling and simulation, and characterization.
Dr. Liou holds 18 patents and has published 13 books, more than 320 journal papers (including 21 invited review articles), and more than 260 papers (including more than 110 keynote and invited papers) in international and national conference proceedings. Dr. Liou received ten different awards on excellence in teaching and research from the University of Central Florida (UCF) and six different awards from the IEEE. Among them, he was awarded the UCF Pegasus Distinguished Professor (2009) – the highest honor bestowed to a faculty member at UCF, IEEE Joseph M. Biedenbach Outstanding Engineering Educator Award in 2004 for exemplary engineering teaching, research, and international collaboration, and IEEE Electron Devices Society Education Award in 2014 for promoting and inspiring global education and learning in the field of electron devices. His other honors are Fellow of IEEE, Fellow of IET, Fellow of Singapore Institute of Manufacturing Technology, Distinguished Lecturer of IEEE Electron Device Society (EDS), Distinguished Lecturer of National Science Council, and Chang Jiang Scholar Endowed Professor of Ministry of Education, China – the highest honorary professorship in China.